Název:	Investigation and Implementation of Test Vectors for Efficient IC Analysis
Autoři:	Brutscheck, M. Franke, M. Schwarzbacher, Th. Becker, St.
Citace zdrojového dokumentu:	Electroscope. 2008, Konference EDS 2008. EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.
Datum vydání:	2008
Nakladatel:	Západočeská univerzita v Plzni, Fakulta elektrotechnická
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	http://hdl.handle.net/11025/515 http://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/brutscheck.pdf
ISBN:	978-80-214-3717-3
ISSN:	1802-4564
Klíčová slova:	integrované obvody CMOS;analýza integrovaných obvodů;testovací vektory;neinvazivní klasifikační metody
Klíčová slova v dalším jazyce:	CMOS integrated circuits;analysis of integrated circuits;test vectors;non-invasive classification methods
Abstrakt v dalším jazyce:	Up until now, the efficient and structured analysis of unknown CMOS integrated circuits (ICs) has become a topic of great relevance. In the last decade different invasive and non-invasive strategies have been developed to analyse unknown ICs. However, invasive procedures always lead to the destruction of the system under investigation. Non-invasive approaches published so far have the disadvantage that ICs are analysed using very complex algorithms. Here, no division is carried out to avoid extensive analysis times in the case that only simple structures are investigated. This paper describes the investigation and implementation of test vectors for efficient IC analysis. To demonstrate the correct operation the non-invasive classification procedure will be used. Furthermore, in this research the properties of several test vectors will be analysed and implemented into analysis environment. All sections of the procedure proposed are simulated and fully tested on ISCAS-85, ISCAS-89 and ISCAS-99 benchmark or user defined models of real ICs and the results are presented in this paper. In every circuit analysed the behaviour has been successfully determined by the use of the proposed test vectors.
Práva:	Copyright © 2007-2010 Electroscope. All Rights Reserved.
Vyskytuje se v kolekcích:	2008 Konference EDS 2008 (2008)

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